Solutions

Hubble

machine vision
solution

Deep learning-based vision solution maximizing your productivity beyond traditional vision inspection tools and methods

Deep learning-based vision solution maximizing your productivity beyond traditional vision inspection tools and methods

Scope of Hubble

Deep learning-based defect classification model

Classify newly discovered defects with AI models that learn various defect types in real-time

Small scale image extraction

Detect and extract product abnormalities within region of interest for detailed analysis

Enhanced quality control

Improve anomaly detection rate and accuracy with verified continual learning algorithms

Main Technology

Main Technology

Image preprocessing

RTM delivers easy-to-understand data for all users through advanced image processing technology

Model customization

RTM adjusts target regions based on user image requirements to maximize detection accuracy

Data augmentation

RTM technology enables users with limited data to create a quality AI model.

Fault cropping

RTM detects and specifies location of defect for detailed analysis

Use Case

LED Display

Classification

Application : LED void, LED AOI

Semiconductor

Classification, Segmentation

Application : Pellicle

Semiconductor Parts

Classification, Segmentation

Application : Heater block

Use Case

LED Display

Classification

Application : LED void, LED AOI

Semiconductor

Classification, Segmentation

Application : Pellicle

Semiconductor Parts

Classification, Segmentation

Application : Heater block

Request AI Consultation

Learn how our AI solution can help you.
Prepare to take the next step with RTM.

Request AI Consultation

Learn how our AI solution can help you.
Prepare to take the next step with RTM.

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